SPECTANO 100

Dielectric Material Analyzer

Dielectric properties are very important to understand the relationship between the structure and the characteristics of materials. Usually material test systems belong to one of the following two categories:

• Time-domain systems to determine the polarization phenomena (PDC)
• Frequency Domain Spectroscopy (FDS) system for more detailed electrical properties analysis within the material.

The SPECTANO 100 combines the PDC and the FDS method in one device with a wide frequency range from 5 µHz to 5 kHz.  It allows to measurement of all important dielectric material parameters such as permittivity ε, dielectric loss tanδ, capacitance and impedance. Due to the SPECTANO 100's the maximum output voltage of 200 V_peak no additional external booster is needed.

Key features

• Measurement time reduction
  PDC measurements can be accomplished in a short time but are limited to low frequencies. FDS measurements are feasible for high frequencies but take very long at low frequencies. SPECTANO 100 combines the advantages of both methods. The software transforms the time domain current into frequency domain data for subsequent evaluation. This reduces the measurement time up to 75 % compared to exclusive FDS measurements.
• Reduced equipment cost
  The SPECTANO 100 is a light-weight all-in-one system. The max. 200 Vpeak output in time- and frequency domain allows measurements without the need of an additional voltage booster.
• System quality check and data backup
  The SPECTANO 100 software provides different pre-measurements to check the test system before starting a measurement to guarantee cost and time saving work. Functions like Load from device or Save data to back-up file ensure that the test data and results remain accessible in error cases like an accidental disconnection of the device during measurement.
• Multiple setups and potential free measurements
  The SPECTANO 100 device and its cables and adapters allow floating measurements for implementation in grounded application systems and a high variety of measurement setups (e.g. for measurements with high voltages).
• Easy data exchange
  To simplify data exchange and to enable parallel analysis of measurement results on several PCs the SPECTANO analyzer suite can be installed without the need of a specific software license. 
• Easy integration and quick familiarization
  Optional adapters (BNC and 4mm plugs) allow a flexible connection to all common material test cells in the market. Temperature resistant cables and adapters allow to connect the SPECTANO 100 test cells located in a temperature controlled environment from -55 °C to +250 °C. Straight forward simple connection methods in combination with the intuitive SPECTANO analyzer suite software result in a quick familiarization with the test setup.

Applications:

Characterize the insulation, polarization and dielectric loss of solid and liquid materials such as:
•Electrical insulation paper/cellulose
•Nanomaterials (Nano-composites)
•Dielectric components
•Epoxy resins
•Mica
•Polymers
•Insulation Oils
•Display technologies like glasses or polymers
•Thin films

Achieve information on:
•Dielectric properties
•Material aging
•Material structure
•Space charges in multilayer insulations
•Surface or film thickness of coatings
•Curing processes

More information you can find in the datasheet or technical list